Álvarez, Nadia (2016) Dominios magnéticos y respuesta dinámica en aleaciones ferromagnéticas de FePt . / Magnetic domains and dynamical response in ferromagnetic FePt alloys. Tesis Doctoral en Física, Universidad Nacional de Cuyo, Instituto Balseiro.
![[img]](/style/images/fileicons/application_pdf.png)
| PDF (Tesis) Español 15Mb | |
| PDF (Resumen) Español 571Kb | |
| PDF (Abstract) Español 515Kb |
Resumen en español
El resumen se encuentra en un archivo pdf.
Resumen en inglés
The abstracts is provided as pdf file.
| Tipo de objeto: | Tesis (Tesis Doctoral en Física) |
|---|---|
| Información Adicional: | Área temática: Materiales magnéticos |
| Palabras Clave: | Thin films; Capas finas; Ferromagnetism; Ferromagnetismo; Anisotropy; Anisotropía [Residual stress; Tensiones residuales; Magnetic anisotropy; Anisotropías magnéticas] |
| Referencias: | [1] S. Okamoto, N. Kikuchi, O. Kitakami, T. Miyazaki, Y. Shimada, K. Fukamichi, Phys. Rev. B 66, 024413 (2002). 1, 11, 95, 103, 116 [2] W. Tangwatanakul, K. Chokprasombat, C. Sirisathitkul, P. Jantaratana, Y. Sirisathitkul, J. of Alloys Comp. 654, 234-239 (2016). 1 [3] O. Crisan, A.D. Crisan, I. Mercioniu, R. Nicula, F. Vasiliu, J. Magn. Magn. Mat. 401, 711-715 (2016). [4] M. N. Ashiq, R. B. Qureshi, M. A. Malana, M. F. Ehsan, J. of Alloys Comp. 617, 437-443 (2014). [5] C. A. Ross, Annu. Rev. Mater. Res. 31, 203-35 (2001). 1 [6] Lei Ma, Z. W. Liu, H. Y. Yu, X. C. Zhong, Y. P. Zeng, D. C. Zeng, X. P. Zhong; IEEE Trans. Magn. 47, 10 (2011). 1 [7] J. U. Thiele, K. R. Coey, M. F. Toney, J. A. Hedstrom, A. J. Kellock, J. Appl. Phys. 91, 6595 (2002). 2 [8] K. Barmak, J. Kim, L. H. Lewis, K. R. Coey, M. F. Toney, A. J. Kellock, J.-U. Thiele, J. Appl. Phys. 95, 7501 (2004). 2, 3, 5, 6 [9] R. A. Ristau, K. Barmak, L. H. Lewis, K. R. Coey, J. K. Howard, J. Appl. Phys. 86, 4527 (1999). 2 [10] R. F. C. Farrow, D. Weller, R. F. Marks, M. F. Toney, S. Hom, G. R. Harp, A. Cebollada, Appl. Phys. Lett. 69, 1166 (1996). 2 [11] T. B. Massalski (editor), H. Okamoto, P. R. Subramanian, L. Kacprzak, Binary Alloy Phase Diagrams, 2nd ed., ASM International, Materials Park, Ohio, p. 1752 (1990). 2 [12] P. Fredriksson, B. Sundman, A thermodynamic assessment of the Fe-Pt system, Calphad 25 (4), 535-548 (2001). 3 [13] F. E. Spada, F. T. Parker, C. L. Platt, J. K. Howard, J. Appl. Phys 94, 5123 (2003). 3, 5, 6, 13, 49, 50, 91, 98, 150 [14] L. M. Magat, G. V. Ivanova, L. V. Solina, N. N. Shegoleva, Ya. S. Shur, Fiz. Metall. Metalloved. 29, 400-403 (1970). 3 [15] A. Menshikov, T. Tarnoczi, E. Kren, Phys. Stat. Sol. A 28, K85-K87 (1975). 3 [16] G. E. Bacon, J. Crangle, Chemical and magnetic order in platinum-rich Pt+Fe alloys, Proc. Royal Soc. London A 272, 387-405 (1963). 4 [17] Berry, D.C., Barmak, K., J. Appl. Phys. 102, 2 024912 (2007). 4, 5, 6, 95 [18] E. Sallica Leva, R. C. Valente, F. Martnez Tabares, M. Vasquez Mansilla, S. Roshdestwensky, A. Butera, Phys. Rev. B 82, 144410 (2010). 4, 5, 6, 7, 14, 15, 41, 42, 51, 57, 61, 70, 74, 94, 95, 99, 109, 114, 115, 116, 135, 136, 137, 139 [19] J. M. Guzman, N. Alvarez, H. R. Salva, M. Vasquez Mansilla, J. Gomez, A. Butera, J. Magn. Magn. Mat. 347, 61 (2013). 4, 20, 98, 109 [20] M. Hehn, S. Padovani, K. Ounadjela, J. P. Bucher, Phys. Rev. B 54, 3428 (1996). 4, 14, 15, 17, 117, 135 [21] V. Gehanno, Y. Samson, A. Marty, B. Gilles, A. Chamberod. J. Magn. Magn. Mat. 172, 26 (1997). 4, 14, 17 [22] A. Asenjo, J. M. Garca, D. Garca, A. Hernando, M. Vazquez, P. A. Caro, D. Ravelosona, A. Cebollada, A. Briones, J. Magn. Magn. Mat. 196, 23 (1999). 4, 14 [23] R. Brucas, H. Hafermann, M. I. Katsnelson, I. L. Soroka, O. Eriksson, B. Hjorvarsson, Phys. Rev. B 69, 064411 (2004). 4, 14 [24] C.A. Ramos, E. Vassallo Brigneti, J. Gomez, A. Butera, Physica B 404, 2784 (2009). 4, 14, 17 [25] E. Burgos, E. Sallica Leva, J. Gomez, F. Martnez Tabares, M. Vasquez Mansilla, A. Butera, Phys. Rev. B 83, 174417 (2011). 5, 41, 109 [26] S. N. Hsiao, F. T. Yuan, H. W. Chang ,H .W. Huang, S. K. Chen, H. Y. Lee, Appl. Phys. Lett. 94, 232505 (2009). 50, 91, 92, 98, 105, 109 [27] N. H. Luong, V. V. Hiep, D. M. Hong, N. Chau, N. D. Linh, M. Kurisu, D.T.K. Anh, G. Nakamoto, J. Magn. Magn. Mat. 290-291, 559-561 (2005). 5 [28] M. Getzla, Fundamentals of Magnetism, New York: Springer-Verlag Berlin Heidelberg (2008). 5, 9, 10, 13, 15 [29] J.M.D Coey, Magnetism and magnetic materials, 2nd ed. New York: Cambridge University Press (2010). 26, 27, 38 [30] B. D. Cullity, C. D. Graham; Introduction to Magnetic Materials 2nd Ed. (2009). 8, 9, 10, 13, 19, 47, 68, 98, 129 [31] A. Hubert, R. Schafer, Magnetic Domains, 3rd ed. Springer, New York (2009). 15, 17, 115, 141 [32] M.W. Muller: Distribution of the magnetization in a ferromagnet. Phys. Rev.122, 1485-1489 (1961). 16 [33] V. Gehanno, R. Homann, Y. Samson, A. Marty, S. Auret, Eur. Phys. J. B 10, 457-464 (1999). 5, 15, 17, 19, 47 [34] E. Sallica Leva, Estudio del espesor crtico para la formacion de dominios magneticos tipo stripe en pelculas delgadas de FePt (Tesis de maestria). Universidad nacional Mayor de san Marcos, Lima Peru (2011). 5, 7, 42, 64 [35] J. V. Lyubina, Nanocrystalline Fe-Pt alloys: phase transformations, structure and magnetism (Tesis de doctorado), Facultad de Matematicas y Ciencias Naturales - Universidad Tecnica de Dresde, Alemania. (2006). 6 [36] L. Vegard, Zeitschrift fur Physik 5, 17-26 (1921). 6 [37] Cullity, B. D., Elements of X-Ray Diraction, 3rd edition, Addison-Wesley Publishing Co., Reading, MA (1998). 6, 27 [38] Th. de Keijser, E. J. Mittemeijer, H. C. F. Rozendaal, J. Appl. Cryst. 16, 309 (1983). 6, 85 [39] J. Kaczer, M. Zeleny, P. Suda: Czech. J. Phys. 13, 579 (1963). 17, 18 [40] S. Blundell, Magnetism in Condensed Matter, Oxford: Oxford University Press (2001). 8 [41] H. Shima, K. Oikawa, A. Fujita, K. Fukamichi, K. Ishida, J. Magn. Magn. Mat. 272-276 2173 (2004). 11, 13, 49, 98 [42] R. A. McCurrie, P. Gaunt, Philosophical Magazine 13 , 567-577 (1966). 11 [43] T. Suzuki, K. Harada, N. Honda, K. Ouchi, J. Magn. Magn. Mat. 193, 85-88 (1999). 14 [44] Y. Murayama, J. Phys. Soc. Jap. 21, 2253 (1966). 15, 17, 18, 20, 47, 48, 94, 95, 103, 104, 115, 117, 134 [45] A. L. Sukstanskii, K. I. Primak, J. Magn. Magn. Mat. 169, 31 (1997). 15, 19, 20, 47, 104, 115, 117 [46] R. J. Spain, Appl. Phys. Lett. 3, 11 (1963). 16 [47] N. Saito, H. Fujiwara y Y. Sugita; J. Phys. Soc. Japan 19 421, 1116 (1964). 17, 18 [48] N. Saito: Thesis, Tokyo Univ. (1966). 17 [49] C. V. Thompson, R. Carel, Stress and grain growth in thin lms, J. Mech. Phys. Solids 44 (5), 657-673 (1996). 20, 21, 105 [50] S. Tamulevicius, Stress and strain in the vacuum deposited thin lms, Vacuum 51 (2), 127-139 (1998). 21, 22, 49, 105 [51] C. V. Thompson, R. Carel, J. Mech. Phys. Solids, 44, 657 (1996). 22, 49 [52] M. Ohring; Materials Science of thinf lms 2nd Ed. (1991). 22, 26 [53] Azaro, L. F., Elements of X-Ray Crystallography, McGraw-Hill Book Company, New York (1968). 27 [54] O. Anderoglu, Residual stress measurement using X-Ray diraction, Master of Sciences Thesis, Texas A&M University (2004). 29, 89, 90 [55] L. G. Schulz, J. Appl. Phys. 20, 1030 (1949). 30, 87 [56] J. Torres, P. Angarita, B. Cruz, Revista Colombiana de Fsica 43, 3 (2011). 34, 36 [57] C. Richard Brundle, Charles A. Evans, Jr. Shaun Wilson; Encyclopedia of materials characterization, Manning Publications Co. (1992). 35 [58] U. Hartmann, Magnetic Force Microscope, Annu. Rev. Mater. Sci. 29, 53-87 (1999). 37 [59] M. T. Causa, Captulo 5: Resonancia paramagnetica electronica, no publicado. 39 [60] S. Okamoto, O. Kitakami, N. Kikuchi, T. Miyazaki, Y. Shimada, Y. K. Takahashi. Phys. Rev. B 67, 094422 (2003). 46 [61] T. Bublat, D. Goll, J. Appl. Phys. 108, 113910 (2010). 46 [62] P. Sharma, N. Kaushik, A. Makino, A. Inoue, IEEE Trans. Magn. 47, 4394 (2011). 46, 47 [63] P. Gaunt, Philos. Mag. B 48, 261 (1983). 47 [64] X. Guo, X. Chen, Z. Altounian, J. O. Ström-Olsen, J. Appl. Phys. 73, 6275 (1993). 47 [65] T. W. Kim, R. J. Gambino, J. Appl. Phys. 81, 5184 (1997). 47 [66] J.A. Aboaf, T.R. McGuire, S.R. Herd, E. Klokholm, IEEE Trans. Magn. 20, 1642 (1984). 49, 98, 115 [67] W.Wunderlich, K. Takahashi, D. Kubo, Y. Matsumara, Y. Nishi, J. Alloys Comp., 475 339 (2009). 49, 98 [68] J.E. Schmidt, L. Berger, J. Appl. Phys. 55, 1073 (1984). 49 [69] D. Sander,Reports on Progress in Physics 62, 809 (1999). 49 [70] P. Rasmussen, X. Rui, J. E. Shield, Appl. Phys. Lett. 86, 191915 (2005). 50, 91, 92, 98 [71] G. B. Mitra, T. Chattopadhyay, Acta Cryst. A 28, 179 (1972). 50 [72] H. Masumoto, T. Kobayashi, Trans. Japan Institute of Metals 6, 113 (1965). 50, 92 [73] T. Ichitsubo, K. Tanaka, J. Appl. Phys. 96, 6200 (2004). 50, 92 [74] G. W. D. Spratt, P. R. Bissell, R. W. Chantrell, E. P. Wohlfarth, J. Magn. Magn. Mater. 75, 309 (1988). 51 [75] P. E. Kelly, K. O'Grady, P. I. Mayo, R. W. Chantrell, IEEE Trans. Magn. 25, 3881 (1989). 51 [76] J. Garca Otero, M. Porto, J. Rivas, J. Appl. Phys. 87, 7376 (2000). 51 [77] E. P. Wohlfarth, J. Phys. F 14, L155 (1984). 51 [78] E. P. Wohlfarth, J. Appl. Phys. 29, 595 (1958). 51, 52 [79] X.-D. Che, H. N. Bertram, J. Magn. Magn. Mater. 116, 121 (1992). 52, 60 [80] J. W. Harrell, D. Richards, M. R. Parker, J. Appl. Phys. 73, 6722 (1993). 52, 60 [81] R. Street, J. C. Wooley, Proc. Phys. Soc. London, Sec. A 62, 562 (1949). 52 [82] P. Gaunt, J. Appl. Phys. 59, 4129 (1986). 53, 64, 65 [83] D. H. L. Ng, C. C. H. Lo, P. Gaunt, IEEE Trans. Magn. 30, 4854 (1994). 53 [84] S. Chikazumi, Physics of Magnetism, Krieger Publishing, Florida (1964). 61 [85] G. J. Tomka, P. R. Bissell, K. O'Grady, R. W. Chantrell, J. Phys. D: Appl. Phys. 27, 1601 (1994). 62 [86] P. Gaunt, G. J. Roy, Philos. Mag. 34, 781 (1976). 63, 64, 65, 67 [87] S. J. Collocott, V. Neu, J. Phys. D: Appl. Phys. 45, 035002 (2012). 66 [88] J. Smit, H. G. Beljers, Philips Res. Rep. 10, 113 (1955). 68, 100 [89] Vittoria C, Microwave Properties of Magnetic Films, Singapore: World Scientific p. 87 (1993). 68 [90] R. D. McMichael, D. J. Twisselmann, A. Kunz, Phys. Rev. Lett. 90, 227601 (2003). 68 [91] Butera A., Eur. Phys. J. B 52, 297-303 (2006). 68, 72 [92] Zakeri Kh et al., Phys. Rev. B 76, 104416 (2007). 68 [93] Vittoria C, Yoon S D, Widom A, Phys Rev. B 81, 014412 (2010). 68, 73 [94] Safonov V L, J. Appl. Phys. 91, 8653-5 (2002). [95] Meckenstock R, Spoddig D, Frait Z, Kambersky V, Pelzl J, J. Magn. Magn. Mater. 272-276 1203-4 (2004). 68, 73 [96] D. M. Jacobi, E. Sallica Leva, N. Álvarez, M. Váasquez Mansilla, J. Gómez, A. Butera, J. Appl. Phys. 111, 033911 (2012). 70, 100, 109 [97] N. Álvarez, G. Alejandro, J. Gómez, E. Goovaerts y A. Butera; J. Phys. D: Appl. Phys. 46, 505001 (2013). 72 [98] Mizukami S, Iihama S, Inami N, Hiratsuka T, Kim G, Naganuma, H, Oogane M y Ando Y, Appl. Phys. Lett. 98, 052501 (2011). 72 [99] Chen Z, Yi M, Chen M, Li S, Zhou S y Lai T, Appl. Phys. Lett. 101, 222402 (2012). 72 [100] Alvarez-Prado L M, Pérez G T, Morales R, Salas F H y Alameda J M, Phys. Rev. B 56, 3306-16 (1997). 74 [101] C. Logofatu, C. C. Negrila, R. V. Ghita, F. Ungureanu, C. Cotirlan, C. Ghica, A. Stefan Manea y M. F. Lazarescu; \Study of SiO2/Si Interface by Surface Techniques", National Institute of Materials Physics, Bucharest Romania. 79 [102] N. Nakamura, A. Uranishi, M. Wakita, H. Ogi, M. Hirao, M. Nishiyama, Appl. Phys. Lett. 98, 101911 (2011). 83 [103] M. Imaizumi, C. A. Soufen, C. A. F. Pintao, L. C. Varanda, M. Jafelicci Jr., Materials Science and Engineering A, vol. 167, 521-522 (2009). 83 [104] N. Zotov, A. Ludwig, Intermetallics 16, 113 (2008). 83 [105] T. Ichitsubo, K. Tanaka, J. Appl. Phys. 96, 6220 (2004). 83, 153 [106] A. Al-Ghaferi, P. Mullner, H. Heinrich, G. Kostorz, J. M. K. Wiezorek, Acta Materiala, 54, 881 (2006). 83 [107] G. K. Williamson, W. H. Hall, Acta Metall. 1, 22 (1953). 86 [108] D. Chateigner, P. Germi, M. Pernet; Texture Analysis by the Schulz Re ection Method: Defocalization Corrections for Thin Films; J. Appl. Cryst. 25, 766-769 (1992). 87 [109] F. Bachmann, R. Hielscher, H. Schaeben, Solid State Phenomena 160, 63-68 (2010). 87 [110] B. M. Clemens, J. A. Bain, Stress Determination in Textured Thin Films Using X-Ray Diraction, MRS Bulletin 17, 07 46-51 (1992). 89, 92 [111] P. J. Withers: Key Eng. Mater.: Ceram. Matrix Compos. 108-110, 291- 314 (1995). 89 [112] Slaughter W., The Linearized Theory of Elasticity, Boston: Birkhauser (2002). 91 [113] H. Xu, W. Zhang, B. Peng, W. Zhang, Appl. Surface Science 257 (7), 2689-2693 (2011). 93 [114] Mukesh Kumar, S. Mishra, R. Mitra, Surface and Coatings Technology 228, 100- 114 (2013). [115] H. C. Lee, G. H. Kim, S. K. Hong, K. Y. Lee, Y. J. Yong, C. H. Chun, J. Y. Lee, Thin Solid Films 261, 148-153 (1995). 93 [116] Th. Speliotis, G. Varvaro, A. M. Testa, G. Giannopoulos, E. Agostinelli, W. Li, G. Hadjipanayis, D. Niarchos, Appl. Surface Science 337, 118-124, (2015). 93 [117] Mannan Ali; Growth And Study Of Magnetostrictive FeSiBC Thin Films For Device Applications; Doctor of Philosophy thesis; Department of Physics & Astronomy, University of Sheeld (1999). 93 [118] H.J. Leamy, A.G. Dirks, J. Appl. Phys. 50 (4), 2871 (1979). 94 [119] H. Kanazawa, G. Lauho, T. Suzuki, J. Appl. Phys. 87, 6143 (2000). 96, 109 [120] I. Horcas, R. Fernandez, J. M. Gomez-Rodrguez, J. Colchero, J. Gomez-Herrero, A. M. Baro,\WSXM: A software for scanning probe microscopy and a tool for nanotechnology"; Review of Scientic Instruments 78, 013705 (2007). 97, 115, 134 [121] M. P. Ruoni, C.B. Ndao , S. Pascarelli, N.M. Dempsey, Direct measurement of the local, atomic-scale, Joule magnetostriction of FePt. Joint Eur. Magn. Symposia, Dublin (2008). Unpublished. 98 [122] I, J.A.C. Bland, B.Heinrich (Eds.), Ultrathin Magnetic Structures, Springer- Verlag, Berlin, p. 75 (2005). 98 [123] T. Yamaguchi, R. Miyagawa, Jpn. J. Appl. Phys. 30, 2069 (1991). 107 [124] C. Kooy, V. Enz, Philips Res. Rep. 15, 7 (1960). 117, 134, 135 [125] M. Romera, R. Ranchal, M. Maicas, C. Aroca, J. Appl. Phys. 110 (8), 083910 (2011). 122 [126] H.D. Arnold, G.W. Elmen; J. of the Franklin Institute 195 (5), 621-632 (1923). 122 [127] Y. Sugita, H. Fujiwara, T. Sato; Appl. Phys. Lett. 10, 229 (1967). [128] Wee Tee Soh, Nguyen N. Phuoc, C. Y. Tan, C. K. Ong; J. Appl. Phys. 114, 053908 (2013). 122, 125, 136 [129] F. Seitz, The Modern Theory of Solids, McGrawHill, New York, p. 487 (1940). 123 [130] R. Tayade; Theoretical and experimental contribution to the study of exchangespring magnets; Doctor of Materials Sciences; Ecole normale superieure de Cachan - ENS Cachan (2014). 124 [131] N. Amos, R. Fernandez, R. Ikkawi, B. Lee, A. Lavrenov, A. Krichevsky, D. Litvinov, S. Khizroev, J. Appl. Phys. 103, 07E732 (2008). 125, 136 [132] G. Wang, C. Dong, W. Wang, Z. Wang, G. Chai, C. Jiang, D. Xue; J. Appl. Phys. 112, 093907 (2012). 125 [133] K. Utsumiya, T. Seki, K. Takanashi; J. Appl. Phys. 110, 103911 (2011). 126, 130 [134] R. Hertel; Zeitschrift für Metallkunde 93 (10), 957{962 (2002). 127 [135] E. Fullerton, J. S. Jiang, S.D. Bader; J. Magn. Magn. Mat. 200, 392-404 (1999). 129, 130 [136] R. Skomski, J. M. D. Coey, Phys. Rev. B 48, 15812 (1993). 130 [137] N. Smith, D. Markham, D. LaTourette; J. Appl. Phys. 65, 4362 (1989). 136 [138] S. D. Kim, J. J. Lee, K. H. Kim, S. H. Lim, H. J. Kim; IEEE Trans. Magn. 35, 5 (1999). 136 [139] A. Layadi, J. W. Lee, J. O. Artman; J. Appl. Phys. 63, 8 (1988). 136 [140] M. Imamura, S. Chikazumi; J. Phys. Soc. Japan 24, 648 (1968). 136 [141] G. C. Bailey, C. Vittoria; Phys. Rev. B 8, 7 (1973). 136 [142] C. H. Wilts, O. G. Ramer; J. Appl. Phys. 47, 3 (1976). 136 [143] N. S. Kiselev, I. E. Dragunov, V. Neu, U. K. Röbler, A. N. Bogdanov, J. Appl. Phys. 103, 043907 (2008). 140 [144] Schaller, Fantozzi y Gremaud: Mechanical Spectroscopy Q"1. Trans Tech Publications, Switzerland Volume 366-368 de Materials Science Forum. (2001). 152, 153 [145] H. A. Colorado Lopera; Friccion Interna en Sistemas Sustrato Metalico-Pelcula de TiN obtenida por pvd; Tesis de Maestra, Universidad Nacional de Colombia; Facultad de Minas Medelln (2004). 153 |
| Materias: | Física > Física de materiales Metalurgia > Aleaciones |
| Divisiones: | Gcia. de área de Investigación y aplicaciones no nucleares > Gcia. de Física > Ciencias de materiales > Resonancias magnéticas |
| Código ID: | 564 |
| Depositado Por: | Tamara Cárcamo |
| Depositado En: | 19 Oct 2016 15:36 |
| Última Modificación: | 20 Oct 2016 10:55 |
Personal del repositorio solamente: página de control del documento
